Circuit Authentication and Reliability Monitoring
The Integrated Circuit market is continually growing in complexity, performance, capacity, and availability. While these very important parameters are key to technology use and insertion, other, sometimes more critical parameters such as reliability and yield, are degrading. As technology nodes advance with Moore's Law, now approaching 22 and 14 nm, processing capabilities struggle to deal with variability and yield relationships for smallest node implementations. Analyzing information from performance traits may be able to provide quick, accurate correlation to models of reliability and lifetime prediction in operating electronics. This research is focused on developing Mixed-Signal and Radio Frequency design techniques to exhibit unique behavior based on inherent random differences in processing/manufacture. These unique behaviors can be used to identify and group circuits of the same pedigree and provide traits for reliability monitoring.
Students Involved: M. J. Casto